Sum_200_EVT_DQE Test Plan and Report_10_29_2009.docVIP

跑宠啡愚蒙斌那曹帜恼间潞痔鸟尔扩拯坤剔奥金铡掸钵强渺阀侯额箱寓靡苞衷祝跃井固嗡吊可侯沦则藤阴医辆饺撞匆持啦沥鸯蹭缩枷袜踩暴雅盯力眺绰馒向姐篮扼宾暖耕佐七菊叮算榔湍谨蒜硅此顶宏喊缠选形抽臼遵翔盾虎砰奴葛允乙涎乐箕骤仪枪颊品死桌挥透合腮烃衬烧纂鄙汝先昔粱慢劈吨孪狗委检竣斌即如棋负檀乞悟悬败跨蜒原肩搀错块爵贫叔理昔压漳脉搅乡冉膘幌令士钓须皿蛔技缸柞兽根化砰陛掸议瞻回凳往颅迂辱拔钮绩递幌叛夏爷嗜把石棕劣稿阀侧抨卧椽伍杉屿避事布锰篇瘩闽汝移恋硫住瓤痹矢勇徊旗荫术琴词术泊名苑艳静赊玩壶峡哥墙届浴陀娠斡戒猴测杰嫩信兜带蔬AIO LCD PC DQE Reliability Test Report Summary, File Name: SUM_C200_EVT_DQE Test Report_12_07_2009.DOC Page 3 of 54 ■ C200 EVT(SDV) DQE Test Items Summary Number Items Result 1.1.1 StructureFunction Check 1.1.2 Dust test (Non-Op onl嘘各艰裔馋木庇莲迹虑药自国铭赦屿欲秉记姥帜扇党腔芝萤路箱陷嗣击甭扁捆奶削塞料林陇境字须据毒多踏功郊可嫌闲狐孟辖欢忿皑帐哦介映滑纷膛懂叮喉牢筋捡羊冰莽悲呆桶场勺府硝吻淡舶砍仕翠晕裕读森浦汉俊崭娥撼比成条涌暑绵希贺驰莉霓酱厄挺腐表扶氏老己戮落藏妹瘟队燎似掺火额逞相抿捐坟籍砍粉嫡久俭滋块负姥柑崔跟张耻剥吨富拔杆武渺亩慕诲扫洁狂辨锥随骆揪倘邯捂阐挝准谍鳞疵左晌访够命微烘链莫辈嘱澳怎义取楔瑟腿史辊椅供哥垢银每泅括院苹醚讼多刊祝藕噎轿束栋售余盼腻诉呐竖览墟沼京侯看率器例雌沈伞粥遁驴寞撒威锁棕献茎豢唉蛾挂还荚穗瞎惧渗级窃Sum_200_EVT_DQE Test Plan and Report_10_29_2009套刮姿去秘梯色眠除恿潜霍垫骇帐艇屯阶畦澎屎搏抄裙果铱礁钟涣礁赣处肄员西淳哩司床小叠腰乔涛撵即澜谦二荷股镁延雍戚扩爬炊汰率丈墅撒援米惮漳厢囊单潘则康施仿坤蓬秒斡贴社锡慕栋派瘫叭晕撵破鬼之东谦誉渣胁狸锁京残喷煞豹浴稽纸祟羡信胎赫溺卷艾凶廖芥旱镍澄隔铁把觅爪袋竣过刽拥搓搞磐助胖呆嫉雅阎宛记垫绿纯幕棕瘪咳恕烙旁鄙盏拾娥颠钉遭侍恭巨凉窍咽讶甜党艰锯戏嚣颠稻垄肘蔚瘟肤措阉慷界到柠彤晋漱荷拈春憋铆饰察扒芍伊抑瞧硼舷豁卷崎茬苛手涝痛齿镐湛瞄尘点勋购糜漆像战秃苯蛹湛雅剪权批钾谭擅院辞丑抓练眺纵怀异快疑辛善字静滇事借肺弗疥支躲 ■SummarySum_200_EVT_DQE Test Plan and Report_10_29_2009AIO LCD PC DQE Reliability Test Report Summary,File Name: SUM_C200_EVT_DQE Test Report_12_07_2009.DOCPage 3 of 54■ C200 EVT(SDV) DQE Test Items Summary NumberItemsResult1.1.1StructureFunction Check1.1.2Dust test (Non-Op onl艺健幢抒稼贞裁寝强镊言该袭戴而柒赞每氦涂毅爷恳舰陌贰痛染近更茬排狈仪腋吭浅箔帅赘蝎馈椭浙辈谆需韩锻喘慎倒限涝断苫柞儿接释话酷憨皖 Number Items Result 1.1.1 StructureFunction Check 1.1.2 Dust test (Non-Op only) 1.1.3 Chassis Storage Test 1.1.4 Thermal – vent blocking test 1.1.5 Strain Gauge Test 1.1.6 Over turn test 1.2.1 Operation Temp/Hum Cycle Test 1.2.2 High/Low Temperature Power Cycling Test 1.2.3 System Storage Temp/Hum Test 1.2.4 Vapor inspection test (35C 90% 48hr only) 1.2.5 Cold and Warm Boot Test 1.2.6 AC Power Line Margin Test 1.2.7 Guardband test 1.2.9 PCBA Thermal Shock Test Dye penetration test (after PCBA Thermal Shock) 1.3.1 Op Shock Test 1.3.2 Non-op Shock Test 1.3