When does atomic resolution plan view imaging of surfaces work.pdfVIP

When does atomic resolution plan view imaging of surfaces work.pdf

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When does atomic resolution plan view imaging of surfaces work.pdf

Ultramicroscopy 170 (2016) 35–42 Contents lists available at ScienceDirect Ultramicroscopy journal homepage: /locate/ultramic When does atomic resolution plan view imaging of surfaces work? Pratik Koirala a, Yuyuan Lin a, Jim Ciston b, Laurence D. Marks a,n a Department of Materials Science and Engineering, Northwestern University, Evanston, IL 60208, USA b National Center for Electron Microscopy, The Molecular Foundry, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA article info Article history: Received 6 April 2016 Received in revised form 7 July 2016 Accepted 5 August 2016 Available online 6 August 2016 Keywords: Transmission electron microscopy Plan view imaging Surface reconstruction abstract Surface structures that are different from the corresponding bulk, reconstructions, are exceedingly dif?cult to characterize with most experimental methods. Scanning tunneling microscopy, the workhorse for imaging complex surface structures of metals and semiconductors, is not as effective for oxides and other insulating materials. This paper details the use of transmission electron microscopy plan view imaging in conjunction with image processing for solving complex surface structures. We address the issue of extracting the surface structure from a weak signal with a large bulk contribution. This method requires the sample to be thin enough for kinematical assumptions to be valid. The analysis was performed on two sets of data, c(6 ? 2) on the (100) surface and (3 ? 3) on the (111) surface of SrTiO3, and was unsuccessful in the latter due to the thickness of the sample and a lack of inversion symmetry. The limits and the functionality of this method are discussed. 2016 Elsevier B.V. All rights reserved. 1. Introduction The challenge of extracting a signal with low intensity from a projection with other strong signals has always been pertinent to the ?eld of signal processing. A similar challenge exists in the surface science community to extract the surfa

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