NSOM近场光学摘要.pptVIP

其他应用 热辐射的近场机理 近场光学的历史 1928 AD E. H. Synge ( England ) 1973 AD Ash Nichols 微波实验证实 1956 AD O’Keefe 相关理论的提出 1982 AD G. Binning H. Rohrer 第一步STM诞生 1984 AD D. W. Phol 等人 近场光学技术与STM结合 1989 AD R. C. Reddick 等人 发展具有光学回馈的NSOM且开 启了以腐蚀方法制作探针 1992 AD Eric Betzig 近场光学技术与AFM的结合 近场显微术 The near field decays exponentially with distance The tip should be kept at a controllede distance from the sample surface Feed back mechanism: shear force (similar to AFM tapping mode) Feedback detection: quartz oscillator (STM current is not suitable for biological samples; optical methods are disturbing the optical response). xyz piezo Feedback Impedance detector Electrodes Piezo actuator Aperture SNOM Aperture SNOM Illumination Collection Illumination collection Reflection collection Transmission illumination Transmission collection Operational modes Typical set up Aperture SNOM Laser Pol. control feedback control xyz Scanner Detector Topographic image nf optical image Inverted optical microscope Optical fiber Monochromator SNOM tips Aperture SNOM pulling breaking heating Heating and pulling method Turner etching method Hydrofluoric acid Chemical etching Aluminum vapor Glass Al coating Optical fiber SNOM tips Calculation of the distribution of electric field as a function of the tip geometry Aperture SNOM Source: InAs Qdot Point like source l/40 below the surface SNOM tips - pulling Aperture SNOM Core Light propagation Cladding Metal coating SNOM tips - etching Aperture SNOM Core Light propagation Cladding Metal coating Holes are dug by various methods: The best results are obtained by FIB NSOM 应用的优点 与传统光学显微镜比较 衍射极限的突破 ─大幅降低设备成本 理想透镜可分辨的最小距离 D D = 0.61λ NA λ：入射光波长 NA：透镜的数值孔径 与电子扫描式显微镜 ( AFM、STM)比较 非破坏性测量 ─可侦测到真实的表面 ( Real Surface Measurement ) 样品不需繁复的制备手续 无需在真空下检测 具有其他光学性质的优点 应 用 近场光学原理除了 应用于近场光学显微镜、作为纳米尺寸的局部光学强度与材料的光学特性等测量用外，由于此技术同