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A solution-processed high-efficiency p-NiO_n-ZnO heterojunction photodetector
RSC Advances
PAPER
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View Article Online
View Journal | View IssueA solution-proceaMaterials Science and Engineering Divis
National Institute of Standards and Tech
E-mail: ratan.debnath@
bDepartment of Electrical and Computer Eng
Park, MD 20742, USA
cN5 Sensors Inc., Rockville, MD 20852, USA
dSemiconductor and Dimensional Metro
Laboratory, National Institute of Standar
20899, USA
eKey Laboratory for the Physics and Chem
Beijing, China
fInstitute for Research in Electronics and A
College Park, MD 20742, USA
Cite this: RSC Adv., 2015, 5, 14646
Received 14th November 2014
Accepted 19th January 2015
DOI: 10.1039/c4ra14567d
/advances
14646 | RSC Adv., 2015, 5, 14646–1465ssed high-efficiency p-NiO/n-ZnO
heterojunction photodetector
Ratan Debnath,*a Ting Xie,ab Baomei Wen,ac Wei Li,de Jong Y. Ha,af
Nichole F. Sullivan,c Nhan V. Nguyend and Abhishek Motayedaf
This paper presents a high efficiency heterojunction p-NiO/n-ZnO thin film ultraviolet (UV) photodetector
(PD) fabricated on conductive glass substrates. The devices are fabricated by using a simple spin-coating
layer-by-layer method from precursor solutions. Photodiodes show good photoresponse and quantum
efficiency under UV illumination. With an applied reverse bias of 1 V, the devices show maximum
responsivity and detectivity of 0.28 A W1 and 6.3 1011 Jones, respectively, as well as high gain with
external quantum efficiency (EQE) of over 90%. By employing ultrathin Ti/Au as top UV transparent metal
contacts, this architecture allows the PDs to be illuminated either through glass or metal side. Laser
beam induced current is used to examine the local variation of EQE providing information on the
photoresponse behavior within the device. Optical properties of NiO and ZnO deposits have also been
explored.1. Introduction
Trans
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