DOI 10.1007s10836-006-0627-8 Reliability and Defect Tolerance in Metallic Quantum-dot Cellu.pdfVIP

JOURNAL OF ELECTRONIC TESTING: Theory and Applications, 2007 * 2007 Springer Science + Business Media, LLC. Manufactured in The United States. DOI: 10.1007/s10836-006-0627-8 Reliability and Defect Tolerance in Metallic Quantum-dot Cellular Automata MO LIU AND CRAIG S. LENT Department of Electrical Engineering, University of Notre Dame, Notre Dame, IN 46556, USA lent@nd.edu Received March 2, 2006; Revised October 17, 2006 Editor: M. Tehranipoor Abstract. The computational paradigm known as quantum-dot cellular automata (QCA) encodes binary information in the charge configuration of Coulomb-coup