Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems英文文献资料.docVIP

下载本文档

2
0
约3.25万字
约 11页
2017-05-10 发布于上海
举报
版权申诉

Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems英文文献资料.doc

1、原创力文档（book118）网站文档一经付费（服务费），不意味着购买了该文档的版权，仅供个人/单位学习、研究之用，不得用于商业用途，未经授权，严禁复制、发行、汇编、翻译或者网络传播等，侵权必究。。
2、本站所有内容均由合作方或网友上传，本站不对文档的完整性、权威性及其观点立场正确性做任何保证或承诺！文档内容仅供研究参考，付费前请自行鉴别。如您付费，意味着您自己接受本站规则且自行承担风险，本站不退款、不进行额外附加服务；查看《如何避免下载的几个坑》。如果您已付费下载过本站文档，您可以点击这里二次下载。
3、如文档侵犯商业秘密、侵犯著作权、侵犯人身权等，请点击“版权申诉”（推荐），也可以打举报电话：400-050-0827(电话支持时间：9:00-18:30)。
4、该文档为VIP文档，如果想要下载，成为VIP会员后，下载免费。
5、成为VIP后，下载本文档将扣除1次下载权益。下载后，不支持退款、换文档。如有疑问请联系我们。
6、成为VIP后，您将拥有八大权益，权益包括：VIP文档下载权益、阅读免打扰、文档格式转换、高级专利检索、专属身份标志、高级客服、多端互通、版权登记。
7、VIP文档为合作方或网友上传，每下载1次，网站将根据用户上传文档的质量评分、类型等，对文档贡献者给予高额补贴、流量扶持。如果你也想贡献VIP文档。上传文档

Built-in Test Enabled Diagnosis and Tuning of RF Transmitter Systems英文文献资料

HindawiPublishingCorporation VLSIDesign Volume2008,ArticleID418165,10pages doi:10.1155/2008/418165 ResearchArticle Built-inTestEnabledDiagnosisandTuningof RFTransmitterSystems VishwanathNatarajan,RajarajanSenguttuvan,ShreyasSen,andAbhjitChatterjee SchoolofElectricalandComputerEngineering,GeorgiaInstituteofTechnology,Atlanta,GA30332,USA CorrespondenceshouldbeaddressedtoVishwanathNatarajan,vishwa@ Received29October2007;Accepted17February2008 RecommendedbyBozenaKaminska Built-InRFtestisachallengingproblemduetotheneedtomeasurethevaluesofcomplextestspeci?cationson-chipwiththe precisionofexternalRFtestequipment.BITtechniquesarenecessaryforguidingsystemadaptationduring?eldoperation.Prior research has demonstrated that embedded RF sensors can generate signi?cant information about RF circuit performance. In thispaper,weproposeatestmethodologythatenablese?cientBITandBIT-enabledtuningofRFsystems.Atestgeneration approachisdevelopedthatco-optimizestheappliedteststimulus,thetypeofembeddedsensors,andthesystemresponsecapture mechanismsformaximalaccuracyoftheBITprocedure.ThisBITtechniqueisalsousedtoperformdiagnostictestingofthe transmitter.Theinformationgatheredfromdiagnosisisusedtotunethetransmitterforimprovedperformance.Simulationresults demonstratethatBIT-assisteddiagnosisandtuningcanbeperformedwithgoodaccuracyusingtheproposedmethodology. Copyright?2008VishwanathNatarajanetal.ThisisanopenaccessarticledistributedundertheCreativeCommonsAttribution License,whichpermitsunrestricteduse,distribution,andreproductioninanymedium,providedtheoriginalworkisproperly cited. 1. INTRODUCTION future, higher speed circuits will be possible with scaled devices.However,theresultingcircuitswillbeincreasingly susceptibletomanufacturingprocessvariationsandcoupled noisefromvariouson-chipsources.TheformerresultsinRF circuitnonidealitiesduetononlinearbehaviorandmismatch e?ects.Thelatterismanifestedassignalintegrityproblems dueto Wireless communications for both mobile and in-o?ce (point-to-pointcommunic