FR4介电常数和损耗正切.pdf

UMR EMC Laboratory Dept. of Electrical Computer Engineering 1870 Miner Circle University of Missouri – Rolla Rolla, MO 65409-0040 UMR EMC Laboratory UMR EMC Laboratory Technical Report: TR00-1-041 Determining Dielectric Constant and Loss Tangent in FR-4 Chen Wang March 2000 UMR Technical Report 1. Introduction The design of high-speed circuits requires a knowledge of the dielectric constant (ε) and loss r parameter (tanδ) of the substrate. This is particularly important when using FR-4 material because of the wide variations encountered among different vendors and even between different orders from the same vendor. It is therefore desirable to develop a method allowing the design engineer to personally determine the ε and tanδ of a substrate material. r 2. Measurement Procedure The procedure begins by metalizing the substrate on all sides hence forming a rectangular resonant cavity. A small hole is drilled through the material for insertion of the probe feed. Next, the S11 parameter is