Accurate Permittivity Measurements for Microwave Imaging via Ultra-Wideband Removal of Spurious Reflectors.docVIP

Sensors 2010, 10, 8491-8503; doi:10.3390/s100908491 OPEN ACCESS sensors ISSN 1424-8220 /journal/sensors Article Accurate Permittivity Measurements for Microwave Imaging via Ultra-Wideband Removal of Spurious Reflectors Mathew G. Pelletier 1,*, Joseph A. Viera 2, John Wanjura 1 and Greg Holt 1 1 United States Department of Agriculture, Agricultural Research Services, Lubbock TX, 79403 USA; E-Mails: John.Wanjura@ (J.W.); Greg.Holt@ (G.H.) 2 Sensors Group Microsemi Corp. Lowell MA, 01851 USA; E-Mail: jviera@ * Author to whom correspondence should be addressed; E-Mail: Mathew.Pelletier@. Re