x射线衍射测量残存应力试验领导书(国外英文资料).docVIP

x射线衍射测量残余应力实验指导书(国外英文资料) The X-ray diffraction method measures the residual stress of the material The purpose and requirements of the experiment Understand the preparation and residual stress characteristics of the material. Master X-ray diffraction (XRD) method to measure the experimental principle and method of residual stress of materials. Understand the concept, classification and testing method of surface residual stresses, and master the operation of XRD instruments. Second, the basic principle and the equipment of the experiment X-ray diffraction measures the principle of residual stress When there are internal stresses in the polycrystalline materials, there must be an internal strain corresponding to it, causing the internal structure (the relative position of the atoms) to change. This is reflected in the X-ray diffraction spectrum, which can be measured by analyzing the diffraction information. There are three types of internal stress in the material. In the class I stress, the balance of stress is macro size, which usually causes the X ray line displacement. Because the inner stress of the ith class is larger than the balance, it is the remote internal stress, and the stress release must cause the change of the macroscopic dimension of the material. The inner stress of the second class, the equilibrium range of stress is the grain size, which is usually caused by the spread of the diffraction spectrum. Class III stress, the balance of stress is the unit cell, which generally causes the diffraction intensity to decrease. ?? The inner stress of class II and III class III is smaller than the equilibrium range, which is the short range internal stress, and not the macroscopic changes of the material after stress release. In general, we measure residual stress as the first kind of residual stress. When materials exist in the unidirectional tensile stress, in parallel to the direction of the stress (HKL) spacing shrinkage reducing (diffraction Angle increase