红外热像仪精确测温技术_李云红.pdfVIP

15　9 　 Vol. 15　No.9 2007 9 　 　 　　　　　　　　　Optics and Precision Engineering 　　　　　　　　　　 Sep. 2007 　1004-924X(2007)09-1336-06 1, 2 1 1 李云红 ,孙晓刚 ,原桂彬 (1. 哈尔滨工业大学,黑龙江 哈尔滨 150001;2.西安工程大学, 陕西 西安710048) :, , ;, , 、 , 。: 0. 7 , 50℃, 0. 1 , 3～5 μ , 0.76～0.89 ℃; 8～ 14 μ , 1.56～ 1.87℃。, 。 　　:红外热像仪;温度测量;误差分析;发射率 :TN219　　:A Accurate measuring temperature with infrared thermal imager 1,2 1 1 LI Yun-hong , SUN Xiao-gang , YUAN Gu-i bin (1. H arbin Institute of Technology , Harbin 150001, China; 2. X i’an Poly technic University , X i’an 710048, China) Abstract:In order to easure the te perature accurately using infrared ther al i ager the interpola- tion of true surface te perature and the influence factors were studied. Based on the principles of ther al radiation and te perature easure ent with infrared ther al i ager, a general for ula for co puting the true surface te perature of objects was given. The influence of e issivity on accurate te perature easure ent was discussed ainly, the conditions of accurate te perature easure ent with infrared ther al i ager were analyzed, and the influence factors fro the surroundings, the at- osphere and the ther al i ager were investigated too. Finally, the theoretical curves of the various factors influencing on the accuracy of easuring te perature were given. The results show that when e issivity is 0. 7, the true te peratureis 50℃, as deflected e issivity is 0. 1, the easuring result of true te perature fluctuating is 0.76 ～0. 89℃for a 3～5μ ther al i ager;and 1. 56～1. 87℃for a 8～14 μ ther al i ager. It is shown that proposed ethod can provide a feasibility for i proving the accuracy of easuring te