DRAM内存Moving Inversion+改进算法的研究毕业.docVIP

　　DRAM内存Moving Inversion+改进算法的研究毕业 随着大容量存储芯片在各种系统中的广泛运用。存储芯片的稳定影响着整个系统的稳定性，因此，对存储芯片的测试显得越来越重要。 目前，从存储芯片的测试成本考虑，高效的测试技术在存储芯片的测试中被普遍使用。针对这一情况，本文对运用最广泛的DRAM内存测试算法进行了研究，通过实验并对不同的内存测试算法作了介绍与比较，特别是对Moving Inversion算法进行改进，提出了具有更高的故障覆盖率，并且具有更好的故障诊断能力的测试算法一Moving Inversion+算法。通过实验，论证了新算法故障诊断能力得到提高。但由于算法的改进，使测试时间略有所增加。 本论文组织如下:首先理论背景，介绍了DRAM内存的测试技术及测试的发展与基本原理。列举了各种主要的故障模型，然后根据传统的Moving Inversion算法提出了改进的Moving Inversion+算法及测试结构。最后通过实验完成对新算法的评测，得出结论，并完成本文的总结。 DRAM Memory Moving Inversion+ Algorithm Analysis Abstract Along emory chip in each kind of system, overall stability of system is affected by memory chips stability, therefore,memory chip test bees more and more important. At present, highly effective test technology is generally used in memory chips test considering of memory chips test cost. In vieost emory test algorithm, made introduction and parison of different memory test algorithm, analysis the improvement of Moving Inversion algorithm, proposed the Moving Inversion+ algorithm ent, the nes failure diagnosis ability has been sharpened at the expense of slightly increased testing time. （转载自.ＮＳＥＡＣ.中国评价网） This paper organized as folloemory test technology, Enumerated main failure model; Then, proposed the improved algorithm一Moving Inversion+ algorithm and its test structure; Finally, pleted evaluation to this ne by experimenting. 目录 第一章绪论....................................................................................................1 1课题背景.............................................................................................1 1. 1. 1可测试性问题简介.............................................................................................1 1. 1. 2测试技术的发展动态.........................................................................................2 2课题的意义及主要工作............................................................................ 3 1. 2. 1课题的意义......................................................................................................... 3 1.2.2本文