院子里显微镜原理应用（Application of microscope in yard）.docVIP

院子里显微镜原理应用（Application of microscope in yard） The basic principle of atomic force microscope Abstract: Binnig and Stanford university in 1985 c. f. Quite and IBM Zurich laboratory Christophe Gerber cooperation launched Atomic Force Microscopy, Atomic Force Microscopy, AFM for short), which is a type does not require conductive sample scanning probe microscope. This microscope through its thickness is the size of an atom probe in a very close distance exploration situation, on the surface of the object can distinguish other microscope can not distinguish the surface detail with characteristics