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Chemical Vapor Deposition University of (化学汽相淀积,大学)
Chemical Vapor Deposition
Chemical Vapor Deposition
Dr. Philip D. Rack
Assistant Professor
Department of Materials Science and
Engineering
The University of Tennessee
Tel (865) 974-5344
Fax (8654) 974-4115
Prack@utk.edu
Page 1
Chemical Vapor Deposition
Step Coverage of CVD Films
High Surface Migration rate Low Surface Migration Rate
Conformal coating
Arrival Angle
θ = 180°
θ = 270°
θ = 90°
Flux is a function of arrival angle (θ)
Page 2
Chemical Vapor Deposition
Flow of Phospho-Silicate Glass (PSG),
Boro-Silicate (BSG) or BPSG
Flow - Elevated temperature step to close pin-holes and
smooth out topography
More flow (lower glass viscosity @ high temperatures) for
higher phosphorus content (% by weight)
A re-entrant profile can cause opens or stringers after etching
gap Re-entrant
profile
If you do fill it in, you may get an
Etch Stringer
Sem cross-sections (10,000X) of samples annealed in steam at 1100°C for 20 min
for the following weight of phosphorus: (a) 0.0 wt. % P; (b) 2.2 wt. % P; (c) 4.6 wt.
% P; (d) 7.2 wt. % P.
Reference: Silicon Processing for the VLSI Era Vol. 1 by Wolf and Tauber, page 187
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