Lecture 12 Electromigration iMechanica（讲座12电迁移iMechanica）.pdfVIP

Spring 2004 Evolving Small Structures Z. Suo Lecture 12 Electromigration This lecture is an abbreviated version of a section in the following article. A PDF file of the article is available online at /suo , Publication 139. Z. Suo, Reliability of interconnect structures. pp. 265-324 in Volume 8: Interfacial and Nanoscale Failure (W. Gerberich, W. Yang, Editors), Comprehensive Structural Integrity (I. Milne, R.O. Ritchie, B. Karihaloo, Edito