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Status and Challenges for NonVolatile Spin (对非易失性的自旋状态和挑战)
Status and Challenges for Non-Volatile
Spin-Transfer Torque RAM (STT-RAM)
Mohamad T. Krounbi
S. Watts, D. Apalkov, X. Tang, K. Moon
V. Nikitin , A. Ong, V. Nikitin, E. Chen
Grandis, Inc.
International Symposium on Advanced Gate Stack Technology
Albany, NY
September 29 – October 1 , 2010
© 2010 Grandis Corporation 9/23/2010 1
Outline
• Grandis Corporation Overview
• STT-RAM Status
– MTJ Write Current Density
– STT-RAM Thermal Stability
– STT-RAM Scalability
– Test Chip results
• Latest Advances in write current performance
• Dual MTJ Design
• Partial perpendicular Anisotropy
• Conclusions
*STT-RAM: Spin Transfer Torque Random Access Memory
© 2010 Grandis Corporation 9/23/2010 2
Grandis Corporation Update
• Joint Development Program with Hynix Semiconductor moving ahead fast
– Hynix has large team working on STT-RAM, expect fully-functional STT-RAM chips this year
– Major paper on high-density STT-RAM chip operation accepted for presentation at IEDM 2010
• Significant progress in MTJ development since last year
– 2x reduction in write current, 30% stability improvement, 10-20% TMR improvement
– In-plane STT-RAM shows clear, scalable path to below 20 nm technology
• Met Phase I targets on $15M DARPA contract six months ahead of schedule
– Demonstrated 0.25 pJ MTJ write energy, $8.6M Phase II begins in September 2010
• Presented key papers at VLSI Symposium, IEEE IMW other major conferences
– Covered latest advances in MTJ materials, scalability of in-plane STT-RAM technology, read disturb
and writ
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