design of higher-k and more stable rare earth oxides as gate dielectrics for advanced cmos deviceshigher-k设计和更稳定的稀土氧化物作为先进cmos器件的栅极电介质.pdfVIP

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design of higher-k and more stable rare earth oxides as gate dielectrics for advanced cmos deviceshigher-k设计和更稳定的稀土氧化物作为先进cmos器件的栅极电介质.pdf

design of higher-k and more stable rare earth oxides as gate dielectrics for advanced cmos deviceshigher-k设计和更稳定的稀土氧化物作为先进cmos器件的栅极电介质

Materials 2012, 5, 1413-1438; doi:10.3390/ma5081413 OPEN ACCESS materials ISSN 1996-1944 /journal/materials Review Design of Higher-k and More Stable Rare Earth Oxides as Gate Dielectrics for Advanced CMOS Devices Yi Zhao Sc

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