电路板组装过程中可消除短路和开路故障的可测试性设计策略_百度文库...（The circuit board assembly to eliminate the short circuit and open circuit fault testability design strategy can process _ Baidu library...）.doc

电路板组装过程中可消除短路和开路故障的可测试性设计策略_百度文库...（The circuit board assembly to eliminate the short circuit and open circuit fault testability design strategy can process _ Baidu library...） In this paper, a contribution by prodigy DOC documents may experience poor browsing on the WAP side. It is recommended that you first select TXT, or download the source file to the local view. A testable design strategy to eliminate short circuit and open circuit faults during circuit board assembly Huicong electronic components business network 2003-07-28 15:58:55 Electronic assembly testing consists of two basic types: bare board testing and load testing. Bare board test is carried out in complete circuit board production, mainly to check the open circuit and short circuit netlist, continuity. There are many other methods of inspection and verification in the process. The load test is done after the assembly process is completed, and it is more complex than the bare board test. Assembly phase testing includes: production defect analysis (MDA), online testing (ICT) and functional testing (enabling products to work in an application environment) and their combination of the three. In recent years, assembly testing has also increased the use of automatic optical inspection (AOI) and automatic X ray inspection. X ray image layered circuit board and different static image plane they can be provided on the circuit board, so as to determine the weld and solder bridging defects. The purpose of the research and testing strategy is to find the essential combination test scheme for a particular product. Before starting the design process, define the simple strategy for implementing the required tests. Consider product testability issues early in the product development cycle, not later. This greatly reduces the test cost of each node from the initial design to the final test, and achieves higher node testability. There are five types of common test, their main functions are as follows: bare board test