电子显微分析（章晓中）教学课件chapter3.pdfVIP

2.7 TEM specimen preparation • The TEM specimen must be electron transparent and representative of the material you want to study. • In most cases your TEM specimen should be – uniformly thin – stable under the electron beam – conducting and nonmagnetic in the laboratory environment electron transparent • The ability of electron beam go through the specimen is mainly dependent on the accelerating voltage, thickness of the specimen, and atomic number of the specimen. • The higher the accelerating voltage and the lower the atomic number of the specimen, the easier the electron beam goes through the specimen. Requirement of specimen thickness • high resolution TEM work: 15nm • Non high resolution TEM work: 50-100nm The thinner, the better! Form of TEM specimen • Self-supporting disk – the specimen itself is made as a self-supporting disk of  3mm, then thinned till electron transparent. • Specimen placed on the supporting grid ( common) – make a specimen smaller than the disk of  3mm and thin enough, then place it on the supporting grid to be thinned till electron transparent. • There are many ways to prepare TEM specimens. The method depend on – kind of material – information you need to obtain. • bear in mind – your technique must not affect what you see or measure – if it does, then you must know how. TEM specimen • Powder specimen • Thin foil specimen (common) – metal – ceramics – cross-section (for interface study) – replication – polymer powder specimen 1. Grind the powder specimen as fine as possible till it is electron transparent 2. place the powder into liquid then ultrasonically stir (超声搅拌）them to disperse them 3. place a d