12c芯片与温度测试.docx

12c芯片与温度测试主程序：#include main.h#include delay.h#include GUI.h#include LCD12864.h#include DS18B20.h#include stc12c5a60s2.h#include i2c.hsbit beep=P1^5;unsigned int i,x1,y1,x2,y2,y,num1;unsigned int temp1;unsigned char Time;unsigned int temp;void bee();void zhexian();void cunchu();void dushu();void InitTimer0(void);void LcdDisplay(int temp);unsigned char At24c02Read(unsigned char );void At24c02Write(unsigned char ,unsigned char );void main(){InitTimer0();ds1820rst();LCD12864_ClearScreen();init_12864();gui_hline(0,127,63);gui_rline(0,0,63);At24c02Write(1,6);writecom_12864(0x90); writedat_12864(At24c02Read(1));while(1){ temp=read_temp();cunchu();dushu();LcdDisplay(temp);if(Time==20);{zhexian();}}}void LcdDisplay( int temp) //12864显示{ display_12864(1,0,+); writecom_12864(0x80+1); //显示位置writedat_12864(0x30+temp%10000/1000);writedat_12864(0x30+temp%1000/100); display_12864(1,2,.); writedat_12864(0x30+temp%100/10);writedat_12864(0x30+temp%10);display_12864(1,4,C);}void InitTimer0(void) //10ms{ TMOD = 0x01; TH0 = 0x0D8; TL0 = 0x0F0; EA = 1; ET0 = 1; TR0 = 1;}void Timer0Interrupt(void) interrupt 1 { TH0 = 0x0D8; TL0 = 0x0F0; Time++; i++;if(temp=3000){beep=~beep;delayms(1);}}void cunchu()//储存数到24c02{ At24c02Write(8,temp%10000/1000+0x30); //将读取的温度值十位处理成字符写入24c02的储存地址8 delayms(200); At24c02Write(9,temp%1000/100+0x30); //将读取的温度值个位位处理成字符写入24c02的储存地址9delayms(200);At24c02Write(10,temp%100/10+0x30); //将读取的温度值小数处理成字符写入24c02的储存地址10delayms(200); At24c02Write(11,temp%10+0x30); //将读取的温度值小数处理成字符写入24c02的储存地址11delayms(200);}void dushu()//从24c02读出数据{ writecom_12864(0x80+5); //显示位置 writedat_12864(At24c02Read(8)); //读24c02储存地址8数据显示writedat_12864(At24c02Read(9)); //读24c02储存地址9数据显示 writedat_12864(.); writedat_12864(At24c02Read(10)); //读24c02储存地址10数据显示 writedat_12864(At24c02Read(11)); }void zhexian()//折线图{ gui_hline(0,127,63); gui_rline(0,0,63); Time=0;temp1=(temp-2500)/15.625;//从25度到35度y坐标有十度，10/64=0.15625,x1=1+num1*8;//每八格打一个点y1=y;x2=8+num1*8;