Jitter Measurements Using SpectreRF Application Note英文文献.pdfVIP

Jitter Measurements Using SpectreRF Application Note Product Version MMSIM6.0 March 2006  2005-2006 Cadence Design Systems, Inc. All rights reserved. Printed in the United States of America. Cadence Design Systems, Inc., 555 River Oaks Parkway, San Jose, CA 95134, USA Trademarks: Trademarks and service marks of Cadence Design Systems, Inc. (Cadence) contained in this document are attributed to Cadence with the appropriate symbol. For queries regarding Cadence’s trademarks, contact the corporate legal department at the address shown above or call 800.862.4522. Open SystemC, Open SystemC Initiative, OSCI, SystemC, and SystemC Initiative are trademarks or registered trademarks of Open SystemC Initiative, Inc. in the United States and other countries and are used with permission. All other trademarks are the property of their respective holders. Restricted Print Permission: This publication is protected by copyright and any unauthorized use of this publication may violate copyright, trademark, and other laws. Except as specified in this permission statement, this publication may not be copied, reproduced, modified, published, uploaded, posted, transmitted, or distributed in any way, without prior written permission from Cadence. This statement grants you permission to print one (1) hard copy of this publication subject to the following conditions: 1. The publication may be used solely for personal, informational, and noncommercial purposes; 2. The publication may not be modified in any way; 3. Any copy of the publication or portion thereof must include all original copyright, trademark, and other proprietary notices and this permission statement; and 4. Cadence reserves the right to revoke this authorization at any time, and any such use shall be discontinued immediately upon written notice from Cadence. Disclaimer: Information in this publication is subject to change without notice and does not represent a commi