相位延迟测量仪.pdfVIP

VAWI - RET Automated VAWI Microinterferometer for Accurate Measurements of Phase Plates Retardation • VAriable Wavelength Interferometer (VAWI) • Automated measurements of phase plate retardation • Hi-Tech measurement technology • PC controlled • Measurement accuracy: λ 500 • Measurement repeatability: λ 1000 • Wavelength range: 400nm - 700nm (400nm - 1600nm for quartz phase plates) • Automated system calibration • Complete phase plate characteristics for full wavelength range (phase plate retardation versus wavelength) in a single measurement process • User friendly software • Retardation calculator for a given wavelength • Report with full measurement data documentation stored in a text file VAWI microinterferometer The VAWI microinterferometer utilizes Variable Wavelength Interferometry (VAWI) technique developed in the Institute of Applied Optics. This technology allows a user to measure the complete retardation characterictics for full wavelength range in a single measurement process. Fig.1 presents the various views of the microinterferometer. The system is controlled by a PC control. The measurement process is semi-automatic. A full