第08讲——自动测试生成 超大规模集成电路测试技术知识课件.pptVIP

Lecture 8 Automatic Test Pattern Generation;Contents内容目录;1 Testability Measures可测试性测度;1.1 Purpose目的;1.2 Origins起源;1.4.1 Range of SCOAP MeasuresSCOAP测度范围;1.4.2 Controllability Rules可控制性规则;1.4.2 Controllability Rules (Cont.)可控制性规则（续）;1.4.3 Observability Rules可观察性规则;1.4.3 Observability Rules (Cont.)可观察性规则;1.4.4 D Flip-Flop RulesD触发器规则;1.4.4 D Flip-Flop Rules (Cont.)D触发器规则（续）;1.4.5 Levelization Algorithm 6.1分级算法;1.4.6 Testability Algorithm 6.2可测试性算法;2 Combinational Circuit ATPG 组合电路ATPG;2.1 Functional vs. Structural ATPG功能和结构测试;2.1.1 Compare比较;2.2 Algorithm Completeness算法完备性;2.3 Algebras: 5-Valued and 9-Valued算法代数：5值和9值逻辑代数;2.3.1 Higher-Order Algebras高阶代数;2.4 Types of Algorithms 算法类型;2.4.1 Exhaustive 穷举算法;2.4.2 Random-Pattern Generation随机码生成;2.4.3 Boolean Difference Symbolic Method布尔差分符号方法;Shannon’s Expansion Theorem: F (X1, X2, …, Xn) = X2 F (X1, 1, …, Xn) + X2 F (X1, 0, …, Xn) Boolean Difference (partial derivative): Fj g Fault Detection Requirements: G (X1, X2, …, Xn) = 1 Fj g;2.4.4 Path Sensitization Method路径敏化方法;2.4.4.1 Circuit Example电路实例;2.4.4.1 Circuit Example (Cont.)电路实例（续）;2.4.4.1 Circuit Example (Cont.)电路实例（续）;2.4.5 Boolean Satisfiability布尔可满足性;2.4.5.1 Satisfiability Example for AND Gate;2.4.5.2 Pseudo-Boolean and Boolean False Functions;2.4.5.3 AND Gate Implication Graph隐含图;2.5 Computational Complexity计算复杂性;2.6 History of Algorithm Speedups算法历史;2.7 Fault Coverage and Efficiency故障覆盖率和效率;2.8 Test Generation Systems测试生成系统;2.9 Test Compaction测试压缩;2.9.1 Static and Dynamic Compaction静态和动态压缩;2.9.2 Compaction Example压缩实例;3 Sequential Circuits ATPG时序电路ATPG;3.1 Time-Frames Expansion;3.1.1 Example for Logic Systems实例;3.1.1.1 Five-Valued Logic (Roth)0,1, D, D, X ;3.1.1.2 Nine-Valued Logic (Muth)0,1, 1/0, 0/1, 1/X, 0/X, X/0, X/1, X;3.1.2 Implementation of ATPGATPG实现;3.1.3 Complexity of ATPG计算复杂性;3.1.3.1 Cycle-Free Circuits无环电路;3.1.3.2 Cycle-Free Example无环电路实例;3.1.3.3 Cyclic circuit