半导体激光器可靠性的无损评价技术研究-物理电子学专业论文.docxVIP

- - - 自从上个世纪六十年代发展以来，半导体激光器在光电子科学和技术领域中占有 重要的一席之地。半导体激光器随着不断地在各种领域中得到了适合的应用之后，半 导体激光器的发展极其迅猛。如今半导体激光器在光纤通信，生物医疗，信息存储等 领域中都有着普遍应用并且应用的范围也在不断地扩展。 半导体激光器的无损评价技术有助于半导体激光器的筛选，能够快速地筛选出可 靠性高的器件，有利于缩短产品测试周期，避免了传统方法中所带来的资源损耗和浪 费。电导数方法是目前对于半导体激光器进行无损评价方法中处于优势地位的方法之 一。 本文基于电导数方法和传统的电老化方法来对器件的评价技术开展了相关实验 工作。对 12 个器件进行传统的电老化，在器件的老化过程中监测其 P-I-V 特性参数， 光场分布情况和电导数参数的变化。处理了大量的数据为电导数方法理论提供支撑。 分析了样品期间的电特性参数变化趋势和光场分布变化趋势，结合了电导数方法的变 化与器件的寿命关系来对样品器件在老化过程中的变化进行了定性分析。作者建立了 结特征参量变化量的方法来对半导体激光器进行退化模式的分析。 关键词：半导体激光器 可靠性 电导数 老化 ABSTRACT Since 60 s last century, the semiconductor laser is very important in the field of optoelectronic science and technology. Semiconductor laser is suitable for many applications in many fields. The development of semiconductor laser is extremely fast. Now semiconductor laser is used in optical fiber communication, biological medicine, information storage, and it spread really fast int many other fields. Nondestructive evaluation of semiconductor laser is good for screening semiconductor lasers, It is able to screen out the devices with high reliability quickly, It can make the process of product testing time shorter, so that avoid the resources waste of traditional method. Electricity derivative method is used in the nondestructive evaluation method for semiconductor laser screening, recent years. This article is based on electricity derivative method and the traditional electrical aging method to evaluation technology to carry out the relevant experimental work on the sample devices. Make 12 sample devices test traditional electrical aging, in the aging process of sample devices, monitoring the P - I - V characteristic parameters of sample devices, and the light field distribution and the change of electricity derivative parameters. Deal with a large amount of data for the electrical derivative method to provide theory for support this article. Analysing the electrical properties parameter changing trend and optical field distribution changes of sample devi