单晶硅超光滑光学元件加工工艺及检测技术的研究道.docVIP

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单晶硅超光滑光学元件加工工艺及检测技术的研究道.doc

单晶硅超光滑光学元件加工工艺及检测技术的研究道

Y 9 3D 78 5分类号: 密级:——U D C: 单晶硅超光滑光学元件加工工艺及检测 技术的研究 THE RESEARCH oF FABRICATIoN AND TESTING TECHNOLoGY oF THE MoNoCRYSTALLINE SILICoN oPTICAL ELEMENTS WITH SUPER.SMOoTH SURFACES学位授予单位及代码: 拯蚕堡王太堂 I!Q!垒鱼2学科专业名称及代码:监堂王捏lQ璺鱼!QQ 2研究方向:堂堂丞鲑超堂通塞直地二=!二丛捡型 申请学位级别: 亟 ±指导教师:坠盍盎旦量堑 答辩委员会主席:J虱垒打研究生:王 澶 论文评阅人: 摘 要 同步辐射超光滑X射线光学元件的加J:工艺与检测技术是一个新兴的领域,工作在短波段的光学元件的加工工艺及检测是软X射线光学基础技术研究的基本内容之一。 本文叙述了同步辐射光束线光学系统的特点,阐述了我幽同步辐射光学元件的超光滑加j L:及检测技术的研究F1的、意义与背景以及国内研究概况、与国外水平对比的差距。系统介绍了超光滑表面加〕:技术国内外现状及各种加T技术的原理和方法,以及I司步辐射光学元件各种检测技术。 本文着重讲述了单晶硅超光滑光学元件加工及检测的几个加工实例,系统地介绍了对光学元件的加工及检测方法、检测结果,所有检测结果均达到设计技术要求,标志着在该领域,我们已接近或达到国外先进水平。关键字:同步辐射超光滑加工及检测单晶硅 ABSTACT The fabrj cation and testing technology of Lhe super smoothX—rav optical comDonents of the svnchrotron radiation is a newemerging area, it works i n the short waveband and is one of Lhebasic contents of Lhe optics foundation engineering research ofthe sofL X ray. This article described the optical system characteris Li c ofthe synchrotron radjation 1ight beam, the research goal, thcsignj fi cance, the background, the present situation of ourcountrv and the bv contrast with overseas level of our countrvin fabricatj on and testing technology of the super smoothsvnchrotron radiation oDtical comDonents. It briefed thedomestic and foreign present situation of the super—smoothoptical surface processing technology,and each kind of principleand method of the processing techno〕ogy,as well as each kind ofmeasuring techn0109y of the synchrotron radiation opticalcOmpOnents. This article related several examDles on fabrication andtesting of suDer—smooth optical elements made of themonocrystalline silicon emphatically,systematically introducedthe fabrication,the testing method and the testi ng result of theoptical components. All testj ng results achieved the designspecification, it demonstrated we approached or achieved theoverseas a(1vanced〕evcl in this area.Keywords: the synchrotron rad i at i on super—smooth 七hefabrication and testing monocrystal I ine si I

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