《信息存储介质表面结构的原子力显微镜研究》-毕业论文.docVIP

PAGE 信息存储介质表面结构的原子力显微镜研究 摘 要: 原子力显微镜（atomic force microscope，简称AFM）利用微悬臂感受和放大悬臂上尖细探针与受测样品原子之间的作用力，从而达到检测的目的，具有原子级的分辨率。由于原子力显微镜既可以观察导体，也可以观察非导体，从而弥补了扫描隧道显微镜的不足。原子力显微镜是由IBM公司苏黎世研究中心的格尔德·宾宁与斯坦福大学的Calvin Quate于一九八五年所发明的，其目的是为了使非导体也可以采用类似扫描探针显微镜（SPM）的观测方法。原子力显微镜（AFM）与扫描隧道显微镜（STM）最大的差别在于并非利用电子穿隧效应，而是检测原子之间的接触，原子键合，范德瓦耳斯力或喀希米尔效应等来呈现样品的表面特性。 本文工作首先回顾了原子力显微镜(Atomic Force Microscopy，AFM)的发展历程，对原子力显微镜的工作原理进行了理论上的探讨，并针对本原CSPM4000型机进行了整机系统的深入了解，重点利用本原CSPM4000型机对信息存储介质表面结构进行检测！用AFM对光盘(含CD，VCD)上记录信息用的凹坑结构进行了三维检测。所得结论表明AFM在信息存储介质检测过程中具有独特的优势。 关键词：原子力显微镜;探针;光盘;信息存储介质; Information Storage Medium Surface Structure Of Atomic Force Microscopy Research Luo yuanyin (Department of mathematics physics, Anhui Institute of Architecture and Industry, Hefei,230601,China) Abstract: The atomic force microscope (AFM) or scanning force microscope (SFM) is a very high-resolution type of scanning probe microscope, with demonstrated resolution of fractions of a nanometer, more than 1000 times better than the optical diffraction limit. The precursor to the AFM, the scanning tunneling microscope, was developed by Gerd Binnig and Heinrich Rohrer in the early 1980s, a development that earned them the Nobel Prize for Physics in 1986. Binnig, Quate and Gerber invented the first AFM in 1986. The AFM is one of the foremost tools for imaging, measuring and manipulating matter at the nanoscale. The information is gathered by feel the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable the very precise scanning. This paper firstly introduces the development of Atomic Force Microscopy, and the foundational principles of AFM, and then, make a good expatiate of the whole system of the CSPM4000 Scanning Probe Microscope System ．The pit structure on optical disk in detected in tree dimensions by AFM，The obtained results demonstrate that the AFM has particular advantages in the course of detection on storage medium． 目 录