T3SterLED热阻量测系统.PDFVIP

T3Ster LEDT3Ster LED熱阻量測系統熱阻量測系統 ((Measuring thermal resistance of LEDs by T3Ster systemMeasuring thermal resistance of LEDs by T3Ster system)) Outline 儀器廠牌 設備規格 儀器簡介與原理 熱阻量測技術介紹與實例應用分析 儀器聯絡人 服務項目與收費標準 儀器廠牌 Advanced thermal tester for packaged ICs T3Ster® (pronounced Trister) is an advanced thermal tester semiconductor package for thermal characterization, producing a complete package thermal characterization in just a few minutes. Dynamic Thermal Characterization  T3Ster is aimed at dynamic thermal characterization of packaged semiconductor devices (diodes, BJT-s, J- FET-s and MOSFET-s, thyristors, power LED-s), MCM- s and other electrical or MEMS components. With dedicated fixtures and software, characterization of PWB-s and other substrates or thermal interface materials and/or cooling assemblies is also possible. Options and Accessories  T3Sster has a wide range of add-on options that provide flexibility in daily thermal measurement and characterization work, for example:  Automated device calibration with our dry thermostat and a couple of supported liquid-cooled thermostats  Easy connection of any type of thermocouples through the appropriate preamplifiers  Increased level of switched power with the different booster options  Addition of the TERALED unit for high-power LED measurement T3Ster儀器簡介與原理 T3Ster 熱阻量測系統特性 採用順向電壓法 依循 JEDEC JESD 51 (Electrical Test Method) 量測可於 1 micro sec.立即記錄資料點，亦可於短時間內記 錄大量數據，最高可到65000筆。 T3Ster 採取特殊演算法(Network Identification by Deconvolution, NID method) ，並可計算出Cumulative and Differential Structure Function ，可直觀判斷各結構 之熱阻 。 量測出熱阻曲線圖，可明顯看出整體封裝結構各層材料之間 的熱阻值，可有效判斷封裝過程中可能產生的封裝缺陷，亦 可提供製程進行最佳化參數設計。 T3Ster熱阻量測技術介紹 暫態熱阻量測技術 是經由在極短的時間解析度下，量測二極體裝置的暫態溫 度變化，其時間解析度可達1μs 。