基于二元决策图的组合电路测试生成方法研究-计算机应用技术专业论文.docxVIP

The The Research of Test Generation Method for Combinational Circuits Based on Binary Decision Diagrams Abstract Digital-system’s performance is higher than before，and its integration degree also increases rapidly．All these developments are for the improvement of IC (Integrated Circuit)design and manufacturing technology．Especially as the appearance of SoC(System-on-a·Chip)，IC industry request more advanced products with shorter design and developing cycle，smaller volume and higher performance．This trend makes a big challenge for circuit test，and to develop efficient methods for test generati