韭菜表面农药残留的可见-近红外光谱分析方法研究-测绘工程专业论文.docxVIP

万方数据 万方数据 一阶微分后的数据在 SVM 和 Boosting 中的分类效果最好，可以识别韭菜样本表面的农 药种类。 关 键 词：农药残留；可见-近红外光谱；毒死蜱；支持向量机；Boosting 研究类型：应用研究 Subject： Study on Spectrum Analysis Method of HYPERLINK /VIs-NIR Vis-NIR Based on Pesticide Residues on the Surface of Leek Specialty：Surveying Engineering Name： Hu Dong (Signature) Instructor：Hu Rongming (Signature) Zhang Zhouping (Signature) ABSTRACT With the development of economy in China, the quality of people’s life has been improved a lot. Once upon a time, people eat food just for full and now people also care for food nutrition. It proved that the Chinese’s demand for food are higher and higher. So it is important to pay attention to the safety and quality of food. The problem of pesticide residues on agricultural products has become an obstacle to the ensurance of food safety. During the growth process of agricultural products, some illegal traders use pesticide for their own interests in an incorrect way, which results in the pesticide residues of agricultural products exceeding the standard. Thus threatens the health of people. Therefore, there is an urgent need to find a method to detect pesticide residues in a fast and economic way. The visible-near-infrared spectra method has become a kind of method for fast analysis and detection, which has been applied to the detection of pesticide residues. This paper took leek as the experimental object and used the visible-near-infrared spectra method for a nondestructive testing research. This paper used ASD spectrometer to detect leek samples with chlorpyrifos to receive the spectral data. The wavelength of spectrum was in the range of 350-2500nm and the 350-419nm band with more noise has been removed. Then the spectral data was to be preprocessed. The preprocessing method was First Differential (FD), Second Differential (SD), Multiplicative Scatter Correction (MSC) and Standard Normal Variate (SNV). The quantitative analysis models used to detect leek samples with chlorpyrifos were esta