霍尔集成电路设计及其测试系统的研发-微电子与固体电子学专业论文.docxVIP

霍尔集成电路设计及其测试系统的研发-微电子与固体电子学专业论文.docx

  1. 1、原创力文档(book118)网站文档一经付费(服务费),不意味着购买了该文档的版权,仅供个人/单位学习、研究之用,不得用于商业用途,未经授权,严禁复制、发行、汇编、翻译或者网络传播等,侵权必究。。
  2. 2、本站所有内容均由合作方或网友上传,本站不对文档的完整性、权威性及其观点立场正确性做任何保证或承诺!文档内容仅供研究参考,付费前请自行鉴别。如您付费,意味着您自己接受本站规则且自行承担风险,本站不退款、不进行额外附加服务;查看《如何避免下载的几个坑》。如果您已付费下载过本站文档,您可以点击 这里二次下载
  3. 3、如文档侵犯商业秘密、侵犯著作权、侵犯人身权等,请点击“版权申诉”(推荐),也可以打举报电话:400-050-0827(电话支持时间:9:00-18:30)。
  4. 4、该文档为VIP文档,如果想要下载,成为VIP会员后,下载免费。
  5. 5、成为VIP后,下载本文档将扣除1次下载权益。下载后,不支持退款、换文档。如有疑问请联系我们
  6. 6、成为VIP后,您将拥有八大权益,权益包括:VIP文档下载权益、阅读免打扰、文档格式转换、高级专利检索、专属身份标志、高级客服、多端互通、版权登记。
  7. 7、VIP文档为合作方或网友上传,每下载1次, 网站将根据用户上传文档的质量评分、类型等,对文档贡献者给予高额补贴、流量扶持。如果你也想贡献VIP文档。上传文档
查看更多
AbstractAbstract Abstract Abstract As one of most widely used magnetic sensoL hall sensor has wonderful application in the measurement of precision,industrial automation and home appliance,especially the automotive.With the development of IC industry,it is the increasingly high demand that will ensure accurate chip parameters and require high efficiency,SO the tester becomes more intelligent.Some research on hall sensor has been made in the thesis,a switch-type bipolar hall sensor has been designed and analyzed.The tester for hall sensor which has been developed in the thesis Can accurately measure the performance parameters of hall sensor. In chapter one,a brief overview of the importance and developmental status of analog integrated circuits is presented.Based 011 this,a number of mixed—integrated Hall sensor chips are developed.The principle,application and future development of hall sensors iS described in detail. In chapter two,the structure of the hall sensor IC is analyzed.And three kinds of manufacturing processes have been compared.The principle of chopper technology using for eliminating the offset is presented in detail.The design technologies of the future hall sensor include chopper technology,auto—zeroing(AZ)and correlated double sampling(CDS),the micro—power technology with the clock control, programmable technology and spinning current technology.Through improving the structure of bandgap voltage reference source,a good temperature characteristics has been achieved.At the end of the chapter,a typical example about the application of the hall sensor iS illustrated. In chapter three,an overview of the importance of the test on integrated circuit, the developmental status of the domestic integrated circuit and the necessity of RD about hall device testing apparatus is given.A prototype of the tester has been developed successfully.The settlement program,the structure of the system and the circuit diagram are given as well as the process of program desig

您可能关注的文档

文档评论(0)

peili2018 + 关注
实名认证
文档贡献者

该用户很懒,什么也没介绍

1亿VIP精品文档

相关文档