工频过电压耐受下氧化锌压敏电阻冲击老化性能研究.docVIP

工频过电压耐受下氧化锌压敏电阻冲击老化性能研究 张欣「2行鸿彦⑴杨天琦4宋晨曦1,2 (1 .南京信息工程大学江苏省气象灾害预报预警与评估协同创新中心，南京210044; 南京信息工程大学中国气象局气溶胶与云降水重点开放实验室，南京210044; 南京信息工程大学电子与信息工程学院，南京210044; 南京市气象局南京市气象服务中心，南京210009) 摘要：针对氧化锌压敏电阻芯片在8 / 20gs电流冲击初期，芯片压敏电压变化较小，老化程 度无法通过静态参数判别的问题，本文设计了工频过电压耐受下的ZnO圧敏电阻冲击老化 试验，研究了 ZnO压敏电阻芯片不同冲击老化情况，耐受工频恒定不同幅值过电压过程和 耐受阶段流经芯片内部电流几随时间的变化关系；结合双肖特基势垒理论和ZnO压敏电阻 芯片Voronoi网格微观结构模型，分析试验结论。结果表明：耐受工频恒定相同幅值过电压, ZnO压敏电阻芯片经8 / 20ps电流冲击后老化程度越深其流过芯片内部电流心的初始值越 大；且险|值随时间上升速率与初始冲击老化程度呈正比；相同老化程度ZnO圧敏电阻芯片 耐受过电压幅值越大，耐受时间越短，心的初始值越大。这些可为ZnO圧敏电阻冲击老化 劣化初期判别提供依据。 关键词：氧化锌压敏电阻；8 / 20Ms冲击老化；工频耐受下ZnO压敏电阻内部电流；耐受时 间 中图分类号:TM862 文献标识码：A 文章编号：1001-1390(2014) 00-0000-00 Research on the Impact Aging Performance of the Zinc Oxide Varistor Tolerated under the Power Frequency Overvoltage ZHANG XinL2 XING Hong-yan1,3 YANG Tian-qi4 SONG Chen-xik2 (1 ? Collaborative Innovation Center on Forecast and Evaluation of Meteorological Disasters, Nanjing University of Information Science Technology, Nanjing 210044,China. 2. Key Laboratory for Aerosol-Cloud-Precipitation of China Meteorological Administration,Nanjing University of Information Science Technology, Nanjing 210044,China? 3.School of Electronic Infdnnation Engineering, Nanjing University of Information Science Technology, Nanjing 210044,China. 4.Nanjing Service Center of Meteorology, Nanjing Meteorological Bureau, Nanjing 210009,China) Abstract: The impact aging experiment based on the tolerance of the Zinc Oxide varistor under continuous power frequency overvoltage was designed in this paper to solve the problem that the change in the breakdown voltage of the zinc oxide varistor chip at the early stage of the 8 / 20ps current pulse is too small to tell the aging degree of the zinc oxide varistor chip by the static parameter. Different situations of the impact aging, the tolerance of the zinc oxide varistor under different amplitudes of overvoltage and the relationship between the internal current during the tolerance (An) and the time were studied. Experiment