《基于功能覆盖率的处理器运算部件测试》-毕业论文（设计）.docVIP

毕业设计（论文） 题 目 基于功能覆盖率的 处理器运算部件测试 专 业 微电子学 班 级 微电 班 学 生 指导教师 （教授） 基于功能覆盖率的处理器运算部件测试 专业：微电子学 摘 要 测试验证是数字集成电路设计中一个非常重要的环节，一般一个复杂的芯片从设计到封装成型，测试将占用百分之七十的时间。因此，一种能花费最短时间，并且能最大限度测试出芯片中设计错误的测试方法是非常重要的。基于功能覆盖率的测试方法就是一种可信性比较高的测试方法。 本论文主要研究如何用借助仿真工具以及基于功能覆盖率的测试方法，对微处理器中功能部件功能正确性及语法正确性进行批量测试。测试过程是在system verilog平台环境下进行的，应用gcc编译工具和GDB调试工具测试C-modle,以及应用Vcs仿真软件测试RTL代码，最后运用基于功能覆盖率的方法编写覆盖组方案代码以及用嵌入式汇编语言编写测试激励，完成C-modle和RTL代码中除了浮点除、浮点乘加以外的所有运算功能测试任务。测试出部分功能部件模块存在代码语法错误或结构错误，并反馈改正。达到了对数字电路测试验证的目的。 关键词：测试，功能覆盖率，处理器功能部件，IEEE-754浮点标准 Abstract Test verification is a very important part of digital integrated circuit design, and generally a complex chip from design to the package-molding, the test will take up 70% time. Therefor, a mothod of test which cost the shortest time and can test the wrong of the design of the chip maximum extent is very important. Testing method based on functional coverage rate is a method which has a relatively high credibility. In this paper, study how to use the simulation tools and test methods based on functional coverage rate to finish the batch tests of the functional correctness and syntactic correctness of the cpu. Testing process is carried out under the system verilog platform, using GCC compiler tool and GDB debugging tool to test C-modle, and VCS simulation software to test RTL code, finally, finish all the computing functions testing task in the C-modle and RTL code except floating-point addition and floating-point multiply-add using program code coverage group based on functional coverage rate and testing stimulus by the embedded assembly language. Test existences of the syntax error or the structural error in some functional module, then feedback and correct, which has reached the purpose of testing the digital circuit . Key words：Test，Functional coverage，Processor function components， IEEE Standard 754 for Binary Floating-Point Arithmetic 目 录 TOC \o 1-3 \h \z \u