数字设计基础双语课件（第7章）.pptVIP

7.1 The need for testing ? How to know a fault exists? By applying test signals to the primary inputs and observe the primary outputs. If the outputs are different from what is expected, we know a fault exists. ? Why is it necessary for testing ? Detect the reasons for faults, and feed the results back to improve the fabrication process. * 7.1 The need for testing ? What’s affecting the testing effect? The testing effect depends on the degree to which the internal nodes can be controlled and observed. Often, we do not need to find the specific location of the fault, but only that a fault exists in the device. * 7.2 Faults and fault models 1. Fault models In general, faults can be modeled by the effect they have on the functionality of the circuit. Fault models can be divided into two types ? logic fault models, parametric fault models. ? Logic fault models Logic fault models deal with faults that affect the logic function of the circuit. ? Parametric fault models Parametric fault models deal with faults that affect the magnitude of circuit parameters such as voltage, current. * 7.2 Faults and fault models 2. Stuck-at fault Many faults can be modeled as causing a permanent logic 1 or a permanent logic 0 on a signal path (input or output of a gate). Stuck-at-1 fault A fault leading to a permanent logic 0 on a signal path is called stuck-at-0 (s-a-0). A fault leading to a permanent logic 1 on a signal path is called stuck-at-1 (s-a-1). ? Stuck-at-0 fault * 7.2 Faults and fault models 3. Other types of fault Stuck-on fault The type of internal short or open fault leading to an output at an indeterminate intermediate voltage is called stuck-on fault. Stuck-open fault The type of fault exists in CMOS circuits, in which a transistor behaves as an open circuit permanently, and causes the output to maintain its previous value for a short time when both push-down and pull-up transistors are off is called stuck-open fault. * 7.2 Faults and fau