应用波长色散X荧光仪和多晶X射线衍射仪联用技术.docVIP

应用波长色散X荧光仪和多晶X射线衍射仪联用技术 鉴定进口铜矿和含铜物料 吕新明[1]、田延河[2]、宁海龙[1]、王东[1]、谢纯斌[3] [1]阿拉山口出入境检验检疫局技术中心,新疆 阿拉山口市833418 [2]新疆出入境检验检疫局，新疆 乌鲁木齐 830063 [3]石河子大学化学化工学院，新疆石河子市 832003 摘 要：本文首次研究进口可利用含铜物料与进口铜矿属性的不同特性并建立鉴定方法，采用X荧光光谱法和X射线衍射光谱法联用技术建立铜矿和含铜物料属性的鉴别方法。通过X荧光光谱法对铜矿和含铜物料中元素进行定性半定量分析，再用X射线衍射光谱法对铜矿和含铜物料的特征谱峰进行扫描，与X衍射仪中标准卡片比对分析，能够确定铜矿和含铜物料的物相组成。结果显示：X荧光光谱法铜矿和含铜物料的共同特点铜的含量较高，达到冶炼铜对原料的要求，硅、铁、钠、钙和镁元素都能够检出。差异性在铅和锌元素在含铜物料中较高，在铜矿石中基本未检出；在X荧光光谱法检测出的金属元素，通过X衍射仪扫描后与标准图片比对，各元素以不同的形式存在于含铜物料中，且有规律可循。 关键词：铜矿，含铜物料，X荧光光谱法，X射线衍射法，鉴定 Application of wavelength dispersive X-ray fluorescence spectrometer and polycrystalline X-ray diffraction spectrometry identification of imports of copper and copper materials Abstract：In this paper, the properties of imported copper-bearing materials and imported copper ores are studied for the first time, The methods of using X fluorescence spectroscopy and X-ray diffraction spectroscopy to establish the properties of copper and copper materials were established.By X-ray fluorescence spectrometry for copper and copper material qualitative semi-quantitative analysis of elements,With X-ray diffraction spectroscopy characteristics of copper and copper materials scanning spectrum peak, comparative analysis and X diffraction of standard card,To determine the phase composition of copper and copper material.The results show that the high concentration of copper and copper in the fluorescence of the fluorescents and copper,To meet the requirements of the copper, the silicon, iron, sodium, calcium and magnesium are all detectable.Differences between lead and zinc are high in copper, which is largely undetectable in copper deposits;The metal elements detected by fluorescence spectroscopy,After scanning the X-ray diffraction instrument and comparing with the standard images, the elements are present in different forms in the copper containing materials,And there are rules to follow. Keywords：Copper, copper material, X—ray fluorescence, X-ray diffraction 铜矿是指可以利用的含铜的自然矿物集合体的总称，一