材料科学中电子显秘微镜的各种技术介绍.pptVIP

LOGO;1、Introduction;;;;How to form a probe ?;;;;Detectors needed for an AEM;;;;;;;3.Relationship between TEM, SEM and AEM 3.1 TEM Image mode Diffraction mode 3.2 SEM Image mode: SE, BSE, X-Ray Mapping Microanalysis: WDS, EDS 3.3 AEM Imaging mode: TEM, STEM, SEM, Mapping (X-Ray + EELS) Diffraction mode: Scanning probe ? Stationary diffraction pattern Microanalysis: EDS, EELS, micro-diffraction, convergent beam diffraction;;3.2 SEM Image mode: SE, BSE, X-Ray Mapping Microanalysis: WDS, EDS;;;;;;;;3.3 AEM Imaging mode: