stm隧道显微镜分析原理及方法.pptVIP

扫描隧道显微镜分析原理及方法;概述 优点与应用 原理 STM仪器 局限性与发展;stm隧道显微镜分析原理及方法; 概述：　　1933年，德国和等人在柏林制成第一台电子显微镜后，几十年来，有许多用于表面结构分析的现代仪器先后问世。如：TEM、SEM、FEM、FIM、LEED、AES等。1982.年，国际商业机器公司苏黎世实验室的Gerd Binnig博士和 Heinrich Rohrer博士及其同事共同研制成功了世界上第一台新型的表面分析仪器——STM。它的出现使人类第一次能够实时地观察单个原子在物质表面的排列状态和与表面电子行为有关的物理、化学性质，在表面科学、材料科学、生命科学等领域的研究中有着重广阔的前景，被国际科学界认为八十年代世界十大科技成就之一。;;优点与应用：;红细胞三维图像;　ＳＴＭ与ＥＭ、ＦＩＭ的各项性能指标比较;;原理：;stm隧道显微镜分析原理及方法;;STM仪器：;STM仪器：;机械设计：;压电陶瓷：压电现象;隧道针尖：; STM仪器：隧道针尖结构的影响;In Touch with Atoms;stm隧道显微镜分析原理及方法;? The accumulation of debris on the end of the tip can also dull the tip and result in image distortion, as shown below.;Dull or Dirty Tip If the tip becomes worn or if debris attaches itself to the end of the tip, the features in the image may all have the same shape. What is really being imaged is the worn shape of the tip or the shape of the debris, not the morphology of the surface features.;Double or Multiple Tips Double or multiple tip images are formed with a tip with two or more end points which contact the sample while imaging. The above images are examples;Loose debris on the sample surface can cause loss of image resolution and can produce streaking in the image. The image on the left is an example of the loss of resolution due to the build up of contamination on the tip when scanning from bottom-to-top. The image on the right is an example of skips and streaking caused by loose debris on the sample surface. ;计算机控制系统：硬件;计算机控制系统：软件;HL-II 型扫描探针显微镜;GdC82- Peapod 具有空间分辨的局域电子态;HL-II 型扫描探针显微镜;HL-II 型扫描探针显微镜;stm隧道显微镜分析原理及方法;;局限性与发展:局限;局限性与发展:发展;AFM;stm隧道显微镜分析原理及方法;HL-II 型扫描探针显微镜;我国扫描探针显微镜开发和生产;