AEC-Q200 REV D 中英文对照版.docx

AEC-Q200 REV D AEC-Q200 REV D Automotive Electronics Council Component Technical Committee Table of Contents 目录 June 1, 2010 Section章节 Title 内容 Page(s)页码 Scope 范围 6 Description 描述 6 Reference Documents参考文件 7 2.0 General Requirements通用要求 8-10 3.0 Qualification and Requalification认证和重新认证 11-12 4.0 Qualification Tests认证测试 12-13 Table 1 - Qualification Sample Size Requirements表1-认证测试样品数量要求 14-15 Table 2 - Table of Methods Referenced Tantalum and Ceramic Capacitors表2-钽和陶瓷电容器参考方法 16-17 Table 2A - Ceramic/Tantalum Process Change Qualification guidelines for the Selected Test 18 表格2A-陶瓷/钽制程改变认证测试项目选择指南 Table 2B - Acceptance Criteria for Ceramic COG SMD Capacitors表2B-陶瓷COG表面贴装电容器可接受标 19 Table 2C - Acceptance Criteria for Ceramic X7R and X5R SMD Capacitors表2C-陶瓷X7R和X5R表面贴装电容器可接受标准 20 Table 2D - Acceptance Criteria for Ceramic Tantalum and Niobium Oxide Capacitors表2D-钽和氧化铌电容器可接受标准 21 Table 3 - Table of Methods Referenced Aluminum Electrolytic Capacitors表3-铝电解电容器参考方法 22-23 Table 3A - Electrolytic Capacitor Process Change Qualification Guidelines for the Selected Test 24 表格3A-电解电容器制程改变认证测试项目选择指南 Table 4 - Table Methods Referenced Film Capacitors 表4-薄膜电容器参考方法 25-26 Table 4A - Film Capacitor Process Change Qualification Guidelines for the Selection of Test 27 表格4A-薄膜电容器制程改变认证测试项目选择指南 Table 5 - Table of Methods Referenced Magnetics (Inductors/Transformers) 表5-电磁器件（电感/变压器）参考方法 28-29 Table 5A - Inductive Products Process Change Qualification Guidelines for the selection of Test 30 表格5A-感应器件制程改变认证测试项目选择指南 Table 6 - Table of Methods Referenced Networks (R-C/C/R) 表6-网络(R-C/C/R)参考方法 31-32 Table 6A/7A - Networks and Resistors Process Change Qualification Guidelines for Selection of Test 33 表格6A/7A-网络和电阻器制程改变认证测试项目选择指南 Table 7 - Table of Methods Reference Resistors表7-电阻器参考方法 34-35 Table 7B - Acceptance Criteria for Carbon Film Leaded Fixed Resistors表格7B-碳膜引脚固定电阻器的接受标准 36 Table 7C - Acceptance Criteria for Metal Film Leaded Fixed Resistors表格7C-金属膜引脚固定电阻器的接受标准 37 Table 7D - Acceptance Crite