纯石墨中微量元素的光谱测定.docxVIP

纯石墨中微量元素的光谱测定 The determination of trace elements in pure graphite by spectral analysis 纯石墨中微量元素的光谱测定是指利用光谱分析技术，通过对样品中元素的光谱特征进行分析，以测定样品中的微量元素含量。石墨中的微量元素含量对于石墨的性能有着重要的影响，因此，对石墨中微量元素的测定显得尤为重要。 Spectral analysis of trace elements in pure graphite refers to the determination of trace elements in sample by spectral analysis technology, through the analysis of spectral characteristics of elements in the sample. The content of trace elements in graphite has an important influence on the performance of graphite, so it is particularly important to determine the trace elements in graphite. 常用的光谱分析技术有原子吸收光谱法、X射线荧光光谱法和X射线衍射光谱法等。 The commonly used spectral analysis techniques include atomic absorption spectroscopy, X-ray fluorescence spectroscopy, X-ray diffraction spectroscopy, etc. 原子吸收光谱法是利用原子吸收现象，通过对样品中的元素的原子吸收率的测定，从而测定样品中的微量元素含量。原子吸收光谱法测定结果准确，但需要较多的实验操作，耗时较长，因此，一般情况下，采用X射线荧光光谱法和X射线衍射光谱法来测定石墨中的微量元素。 Atomic absorption spectroscopy is used to determine the trace element content in the sample by determining the atomic absorption rate of the elements in the sample. The atomic absorption spectroscopy results are accurate, but it requires more experimental operations and takes a long time, so generally, X-ray fluorescence spectroscopy and X-ray diffraction spectroscopy are used to determine the trace elements in graphite. X射线荧光光谱法是利用X射线照射样品，使样品中的元素发射荧光，通过测定荧光强度，从而测定样品中的微量元素含量。X射线荧光光谱法操作简便，测定速度快，但相对于原子吸收光谱法，X射线荧光光谱法的灵敏度较低。