mil_std_2164电子设备的环境应力筛选过程.pdfVIP

luL-srD-2164(m 5 April 1985 MILITARY STANDAM ENVIRONNE~fi STRESS SCREENING PROCESS FUR ELECTRONIC EQUIPKENT AREA RSLI MIL-STD-2164 (EC) DEPARTMENT OF DEFENSE WASHINGTON, D.C. 20360 ENVIRONMENTAL STRESS SCREENING PROCESS FOR ELECTRONIC EQUIPMENT 1. This Military Standard is approved for use by all Departments and Agencies of the Department of Defense. 2. Beneficial comments (recommendations, additions, deletions) and any pertinent data which may be of use in improving this document should be addressed to: Commander Naval Electronics Systems Command Actn: ELEX 8111 Washington, D.C. 20363 by using che self-addressed Standardization Document Improvement Proposal (DD Form 1426) appearing at the end of this dOcument Or b? letteF, ii f41L-sID-2164(EC) The current phasis on reliability and hardware des%gn integrity. k resulted in an increased potential for providing a basically sound and inherently reliable design. AS this potential has increased, so has the ‘.;, complexity snd density of packaging of contemporary electronic equipment. TTIiS complexity and density smplifies the ever present problems of cie- tecting and correcting latent manufacturiniz defects.