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4380IEEETRANSACTIONSONELECTRONDEVICES,VOL.63,NO.11,NOVEMBER2016

TrapAssistedTunnelingandItsEffecton

SubthresholdSwingofTunnelFETs

RedwanN.Sajjad,Member,IEEE,WinstonChern,StudentMember,IEEE,JudyL.Hoyt,Fellow,IEEE,

andDimitriA.Antoniadis,LifeFellow,IEEE

Abstract—Weprovideadetailedstudyoftheoxide–high-frequencyoperationthatcurrentlyCMOScannot

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