X射线荧光光谱法测定化探样品中主,次和痕量组分.pdfVIP

JIM验与布开究 X射线荧光光谱法测定化探样品中 主、次和痕量组分 张 勤.樊守忠，潘宴山，李国会 (中国地质科学院地球物理化学勘查技术研究所，河北廊坊065000) 摘 要:采用粉末样品压片制样，用PW2440X射线荧光光谱仪对化探样品中氯、澳、硫、 氧化 钠 、氧化镁、三氧化二铝、二氧化硅 、氧化钾、氧化钙、钦、锰、三氧化二铁、钻、锐、拾、忆, 、物、 铅 、杜、 杭、稼、砷、拾等34个组分进行测定。讨论了微量元素的背 锌、铜、镍、机、格、钡、翎、肺、 景选择和谱线重叠校正及氛刚定的问题。使用经验系数法和康普顿散射线作内标校正基体效应， 经标准物质检验，分析结果与标样值吻合，用GBW 07308国家一级标准物质作精密度试验，统计 结果RSD(n=12)除砷、机、镍 、铜6.00o，澳、硫、肺、拾、钦、杭、氧化钠、翎、格、枯和牡14.00o 其余各组分均小于3.0咧 以外， 关键词:X射线荧光光谱法;化探样品;背景;谱线重叠校正;粉末样品压片 中图分类号:0657.34 文献标识码:A 文章编号:1001-4020(2005)08-0547-06 X-RAYFLUORESCENCESPECTROMETRICDETERMINATIONOFMAJOR, MINORANDTRACEELEMENTSINGEOCHEMICALSAMPLES ZHANGQin,FANShou-thong,PANYan-shah,LIGuo-hui (InstituteofGeophysicalandGeochemicalExploration，ChineseAcademyof GeologicalSciences,LangfangHebei065000,China) Abstract:AnX-rayfluorescencespectrometricmethodforthedeterminationofmajor,minorandtrace elementsingeochemicalexplorationsampleswasdevelopedThesamplewaspreparedasapelletunderpressure. Discussionwasemphasizedontheselectionofbackgroundposition,correctionoflineoverlappinganddetermination ofchlorine.Comptonscatteringlineastheinternalstandardandempiricalcoefficientswereusedforthecorrectionof matrixeffect.ThreeChinesenationalreferencematerialsGBW 07301,GBW 07317andGBW 07423wereselected fortheverificationoftheaccuracyofthemethodandtheanalyticalresultswerewellagreedwiththecertificate values.AChinesenationalprimaryreferencematerialGBW07308withlowelementscontentswasselectedfor precisiontest.StatisticalresultsshowedthatRSDs(n=12)werebetterthan3.Oooformajorelementsandothers, exceptforV,Ni,Cu6.0andforNa2O,La,Cr,Co,Nd,Hf,Ce,S,Cl,Br,Th14.0%. Keywords:X-rayfluorescences