Testing Analog amp; Digital ProductsLecture 9 Analog Test.ppt

Copyright 2005, Agrawal Bushnell Day-2 AM-3 Lecture 9 Testing Analog Digital ProductsLecture 9: Analog Test Analog Circuits Operational amplifier (analog) Programmable gain amplifier (mixed-signal) Filters, active and passive (analog) Comparator (mixed-signal) Voltage regulator (analog or mixed-signal) Analog mixer (analog) Analog switches (analog) Analog to digital converter (mixed-signal) Digital to analog converter (mixed-signal) Phase locked loop (PLL) (mixed-signal) Test Parameters DC Continuity Leakage current Reference voltage Impedance Gain Power supply – sensitivity, common mode rejection AC Gain – frequency and phase response Distortion – harmonic, intermodulation, nonlinearity, crosstalk Noise – SNR, noise figure Analog Test (Traditional) DSP-Based Mixed-Signal Test Waveform Synthesizer? 1987 IEEE Waveform Digitizer? 1987 IEEE Circuit Specification Voltage Mode Operation Operational/Timing Spec. Operating Range Spec. Test Plan: Hardware Setup Test Program Pseudocode Analog Fault Models A1 First stage gain R2 / R1 A2 High-pass filter gain R3 and C1 fC1 High-pass filter cutoff frequency C1 A3 Low-pass AC voltage gain R4, R5 and C2 A4 Low-pass DC voltage gain R4 and R5 fC2 Low-pass filter cutoff frequency C2 Bipartite Graph of Circuit Method of ATPG Using Sensitivities Compute analog circuit sensitivities Construct analog circuit bipartite graph From graph, find which O/P parameters (performances) to measure to guarantee maximal coverage of parametric faults Determine which O/P parameters are most sensitive to faults Evaluate test quality, add test points to complete the analog fault coverage Sensitivity Differential (small element variation): S = × = Incremental (large element variation): ρ = × Tj – performance parameter xi – network element Incremental Sensitivity Matrix of Circuit Tolerance Box: Single-Parameter Variation Weighted Bipartite Graph IEEE 1149.4 StandardAnalog Test Bus (ATB) Test Bus