fault coverage analysis of ram test algorithms - paradise.pptVIP

Fault Coverage Analysis of RAM Test Algorithms Marc Riedel McGill University, Montreal, Canada Janusz Rajski Mentor Graphics, Wilsonville, Oregon Outline Motivation Fault Models Methodology and Complexity Fault Simulation Results Conclusions Motivation Coverage Measures Needed Functional Cell Array Model Bit-addressable 2-D array of binary storage elements: Functional Fault Behavior Sensitized/desensitized by write operations. Detected by read operations. Cell Array Fault Models Fault Model Specification Fault models are specified as inputs, not hard-coded. Ex.: 2-cell OR-type Bridging Fault Coverage Analysis Sensitization Desensitization Delayed State Transitions Multiple Faults Multiple Faults (cont.) Sensitized faults change the memory pattern. This affects the sequence of sensitization/desensitization of other faults. Complexity Examples of Test Algorithms Simulation Results for GALPAT Trace of Simulation for ANPSF Test Conclusions RAMFLT Functional Memory Testing A multitude of fault models and test schemes proposed. Quality of fault coverage difficult to assess. To validate new test schemes for: Embedded memories and BIST designs. Specialized memory architectures (e.g., multiport, FIFO). To evaluate and rank existing test algorithms: Deterministic/regular tests. Pseudo-random/irregular tests. ... ... ... . . . . . . . . . . . . Operations: read, write-0, write-1. Sensitized read write write Unsensitized Detected 0 / 1 1 / 0 stuck-at, transition, stuck-open, data-retention Coupling Bridging Neighborhood Pattern Sensitive Single Cell idempotent, inversion, state, dynamic (2-cell and 3-cell versions) AND-type, OR-type (2-cell and 3-cell versions) active, passive, static (type I and type II neighborhoods) sensitization desensitization write op. mem. pattern write op. mem. pattern Format . . . . . . write op. mem. pattern write op. mem. pattern . . . . . . Example 1 1 0 0 1 1 0 1 0 sensitized fault mem. pattern write op. 1 0 sensitizati