NBTI Impact on RF Front End in Wireless Sensor Networks.pdfVIP

362 JOURNALOFELECTRONICSCIENCEANDTECHNOLOGYOFCHINA,VOL．7，NO．4，DECEMBER2009 NBTIImpactonRFFrontEndin W irelessSensorNetworks BoZhao，YuWang，Hua-ZhongYang，nadHuiW nag Abstracf_ nwirelesssensornetwork (WSN)．the lifetimeofchips．AndNBTIe伍0ctisbecomingmoreand communicationnodeistheheartofthewholesystem． more seriOUSespecially with hte feature sizedeclninig． Negative bias temperature instability (NBTI) is Previousworksmanily foCUSon NBTIe伍0ctatdevice becomingoneofthemostimportantfactorsthatdecide 1eve1．orNBTIefrectinlarge．scaledigita1circuits． theIifetimeofnodechips。especiallywith thefeature A WsN iscomposed ofalargenumberoflow—cost sizedeclining．In thispaper,theNBTIimpacton the sensornodesdeployedinhteregiontobedetected．Itisa front．endcircuitsintheW SN nodesisstudied．suchas multi．hop network of self-organiznig system formed voltage—controlledoscillator(vco)，chargepump(CP)， through wireless communication．wim the purpose of Iow noise amplifier (LNA)。and even the whole awareness．acquisition．anddealnigwith山eobjectof transceiversystern．ThecircuitlevelNBTIdegeneration perceptive niformation．As a resultofcombniafion of modelsare builtforthekey modulesand the entire micros‘ensor technology， low’power computing， nad transceiver．ItisshownthatthephasenoiseoftheVCo wrieless newt ork, WSN is a novel technology about willbedeteriOrated．thecurrentmismatch oftheCP acqurinignadprocessnignifomr ation．WSN iswidelyused andthenoisefigureoftheLNA willbothbeincreased， nimilitary,medicalandcommercial；whileitisclassified andthesensitivityandtheadjacentchannelselectivity asoneofhte2lmostnifluentialtechn ologiesandoneof