6_俄歇电子能谱_680304978.pptVIP

俄歇电子能谱的应用－Element Mapping Results of Auger mapping of Cu-Ag-Sn-Bi-based solder.（accelerating voltage: 10 keV, probe current: 10 nA) 通过选择某一个特定的俄歇峰，然后让电子束在表面上进行扫描，就可以获得元素在表面上的分布情况。又称“俄歇图象”。 俄歇电子能谱的应用－Element Mapping Steel Fracture SurfaceSecondary electron image, 10,000X Auger Images - Fe, Sb, CrAES identified the composition of grain boundary particles to be Sb and Cr. These phases resulted in the embrittlement of an aged steel rotor 俄歇电子能谱的应用－Depth Profile 俄歇电子能谱的应用－Depth Profile Scanning Auger microscopy depth profile of passivated stainless steel X射线能谱－EDS 当电子束照射到材料表面上，在内层产生电子空位后，填充该空位的