Safety assessment of near infrared light emitting diodes for diffuse optical measurements 英文参考文献.docVIP

BioMedical Engineering OnLine BioMedCentral Research Open Access Safety assessment of near infrared light emitting diodes for diffuse optical measurements Alper Bozkurt* and Banu Onaral Address: School of Biomedical Engineering, Science and Health Systems, Drexel University, 3141 Chestnut Street, Philadelphia, Pennsylvania 19104, USA Email: Alper Bozkurt* - alper.bozkurt@; Banu Onaral - banu.onaral@ * Corresponding author Published: 22 March 2004 Received: 30 January 2004 Accepted: 22 March 2004 BioMedical Engineering OnLine 2004, 3:9 This article is available from: /content/3/1/9 ? 2004 Bozkurt and Onaral; licensee BioMed Central Ltd. This is an Open Access article: verbatim copying and redistribution of this article are permitted in all media for any purpose, provided this notice is preserved along with the articles original URL. Abstract Background: Near infrared (NIR) light has been used widely to monitor important hemodynamic parameters in tissue non-invasively. Pulse oximetry, near infrared spectroscopy, and diffuse optical tomography are examples of such NIR light-based applications. These and other similar applications employ either lasers or light emitting diodes (LED) as the source of the NIR light. Although the hazards of laser sources have been addressed in regulations, the risk of LED sources in such applications is still unknown. Methods: Temperature increase of the human skin caused by near infrared LED has been measured by means of in-vivo and in-vitro experiments. Effects of the conducted and radiated heat in the temperature increase have been analyzed separately. Results: Elevations in skin temperature up to 10°C have been observed. The effect of radiated heat due to NIR absorption is low – less than 0.5°C – since emitted light power is comparable to the NIR part of sunlight. The conducted heat due to semiconductor junction of the LED can cause temperature increases up to 9°C. It has