智能理论在BIT设计与故障诊断中的应用.PDFVIP

21 1 JOURNAL OF NATIONAL UNIVERSITY OF DEFENS ETECHNOLOGY Vol. 21 No. 11999 X B IT 温熙森　徐永成　易晓山 (410073) 20 ( BI T ) , B I T , B I T , B I T , BI T , B I T , , , T N 06 - The Application of Intelligent Theory to the Built in Test Design and Fault Diagnosis WenXisenXu YongChengYiXiaoshan ( Department of Mechantronics Engineering andInstrumentation NUDT Changsha, , , 410073) Abstract During the last twenty years, the theory and application of built-in test (BIT) have made prominent progress TheBIT technology hasbeenthe effective methodofimproving productstestability anddiagnosisability The. . paper summarizes the trait of BIT technology analyzes itsdeveloping trendsallover the world andgeneralizes the in-, , telligenceof BIT during its phrasesofsystem design, informationprocessandsyntheticdecision, then synthetically ana- lyzes the application to BIT of expert system, neural network, fuzzy theoetic, information fusion andother intelligent theories andbuildsup the theory frame of intelligent BIT. Key words built-intest, artificialintelligence, testability, neuralnetwork 1BIT ( - , ) BIT Built in Test BIT 70 BIT , 80 BIT : (1) : BIT , ; (2) : BIT ; (3) : BIT , VLSI , BIT : (1) BIT AT : AT , AT , AT ; BIT , [1,2] AT (2) : BIT , ( ) , BIT [4] (3) BIT : BIT , X 1998 4 28 : , , 1945 , 98