国产封堵器闭合房间隔缺损过程中的短暂ST段抬高2例_英文_.pdfVIP

# 752# 心 脏 杂 志 (Chin Heart J) 2008, 20( 6) # 临床研究# Transient ST2segm ent2elevation during transcatheter closure ofatrial septal defect(ASD) with ASD occluder m ade in China: A report of two cases WANG Xian, HU Da2yi, SUN Qi, TAN Chen (Department ofCardiology, BeijingM ilitaryGeneralHospita,l Beijing 100700, China) Abstract: AIM The safety and efficacy ofatrial septal defect( SD) occluder( SDO) made in China for transcatheter closure of SD have investigated prospectively. We report thephenomenon oftransientST2segment2elevation(TSTE) during transcatheter closure of SDwith SDOmade in China in this single2centre study. M ET ODS total of35 consecutive patients in whom a septaldefect occluder (Huayishengjie Inc., Beijing, China) was used to close a clinically significant SD were included in our study. ll procedures performed underbasic or local anaesthesiawith transthoracic echocardio2 graphic guidance. Interatrial communicationswere assessed by transthoracic echocardiography(TTE) with reference to size, position in the interatrial septum, proxmi ity to surrounding structures, and adequacy of septal rmi . Device selection was based on andmatched to the stretched diameter ofthe communication. Success defined as deployment ofdevice in a stable position to occlude the interatrial communicationwithout inducing functional abnormality or anatom icalobstruction. Occlu2 sion status determ ined byTTE during procedure and the follow up ofthe study at 3, 6, and 12months. RESULTS In 2 ofthe 35 patients from our centre, a transient ST2segment2elevation greater than 0. 2mV was recorded and angina pectoris occurred during the deployment ofthe device. TheECG changes and the symptoms started abruptly and lasted for (412 ? 21 2) m in. ll theECG changes occurred in lead II, III, and aV