电子显微镜-TEM试验报告.PDFVIP

電子顯微鏡 -TEM實驗報告 班級：碩研機械一甲 學號：MA510112 姓名：洪靜淑 指導老師：王聖璋 老師 Basic Operation and Analysis of TEM Objectives: Familiar with analysis technique of C-TEM, including: Basic structure of electron microscope Bright field image Diffraction pattern Dark field image Sample: Aluminum alloy Instrument: FEI TECNAI F20 Field Emission Gun Transmission Electron Microscope Procedure: 1. Sample on holder 2. Basic structure of electron microscope and essential components of TEM 3. Alignment of TEM for basic observation 4. Taking one picture in bright-field(BF)mode condition with the paper magnifications. 5. Turns to diffraction mode to get diffraction pattern of the Au nanoparticle. 6. Taking one picture of the DP 7. Turn to diffraction mode to select one diffraction spot by OBJ aperture and take one dark field. Report The final report should be included 1. Please schematic the basic structures and components of TEM. 2. Present the JCPDS file of the Al, indexing the diffraction pattern; 3. Compare the image conditions of bright field, contrast mechanism. 4. Measure the d-spacing and lattice constant Al and compare with the theoretical value in JCPDS file. 1. Please schematic the basic structures and components of TEM 電子鎗 第一聚光鏡 EDS 第二聚光鏡 物鏡 試片放置處 SAD 光圈 中間透鏡 投射透鏡 螢光屏 1.電子鎗： 產生電子束，提供一高能量、足夠亮度、且穩定的光源。構成電子鎗的主體有三： 陰極(燈絲) 、柵帽惠奈特柱體( ) 、陽極。做電子鎗燈絲的材料主要有三種類型：鎢絲(W hairpin) 、六硼化鑭(La 單晶、單晶鎢絲。) 2. 透鏡 TEM中透鏡的功能在於偏折電子，使之聚焦。電磁透鏡的優點在於結構較簡單， 缺點則是聚焦電子時，同時也會旋轉電子。TEM內的電磁透鏡組從上而下總共有四組： 聚光鏡(co