tdi型cmos图像传感器列级cyclic adc设计与研究-design and research of tdi cmos image sensor column - level cyclo adc.docxVIP

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tdi型cmos图像传感器列级cyclic adc设计与研究-design and research of tdi cmos image sensor column - level cyclo adc.docx

tdi型cmos图像传感器列级cyclic adc设计与研究-design and research of tdi cmos image sensor column - level cyclo adc

ABSTRACTAs a special kind of line-array image sensor, time-delay-integration image sensor can significantly improve the signal to noise ratio based on multiple exposure for the same object and the result integration. Currently TDI image sensor is mainly implemented with charge-coupled device. However, TDI-CMOS image sensor is becoming a hot spot of research and application since the features of high integration, low power consumption, and resistance to radiation. This paper analysis the 128 stages TDI CMOS image sensor and pay much attention on the design and research of the column-parallel analog to digital converters.Converting the analog pixel output to digital code by the ADCs, TDI-CMOS image sensor can accumulate the results in digital domain. To a large extent the performance of ADC determines the quality of the final image. Cyclic ADC is used as column-parallel ADC in this task. In practice, issues like comparator offset, capacitor mismatch and finite op-amp gain all limit the accuracy of cyclic ADC, and finally influence the image qulity.This paper discusses the method of signal accumulating and the architecture of readout circuit in TDI image sensor, and focuses on the design of the column-parallel cyclic ADC. After analysis on the non-ideal effects of the cyclic architecture, due to charge transfer and digital calibration algorithm, two kinds of methods are respectively introduced in this paper to correct the gain error of cyclic ADC. All the three ADCs are designed in 0.18μm standard CMOS process. After the simulation and verification, the results show that the column-parallel cyclic ADC could achieve 8.92-bit, and 0.37mW power dissipation at a 500KS/s rate. Both two methods can realize the gain error correction functions.KEY WORDS:Time-Delay-Integration, CMOS image sensor, Digital domain accumulation, Cyclic ADC, Gain error correction目录第一章 绪论 11.1 CMOS 图像传感器概述 11.2 TDI 型图像传感器基本工作原理 21.3 TDI-CMOS 图像传感器发展现状 31.4 选题的意义与论文结构 4第二章 TDI CMOS 图像传感器架构分析62.1 像

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