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Abstract
Abstract
Semiconductor devices are widely used in key areas of aerospace, transportation,
electric power, Compared with the United States and other developed countries, there is
still a relatively large gap of semiconductor materials, manufacturing processes,
production technology. In order to accelerate the development of the domestic
semiconductor device technology, the device of pulse voltage measuring that is applied to
test the dynamic parameters of semiconductor devices is needed to develop. The system
uses the LXI bus, so it can set up a distributed test system quickly. Currently, the
international pulse voltage measuring unit does not also have functional features high
speed and high resolution, for this situation, the need to develop high-speed precision
pulse voltage measuring unit.
According to the index requirements of system, this paper discusses the major
components and its implementation of the pulse voltage measurement unit, then presents
system design scheme of the pulse voltage measurement unit through analysis and
comparison. This paper completes three parts of the circuit design, they mainly include
analog channel circuit, data acquisition circuit and LXI bus interface circuit. The analog
channel circuit mainly recuperates the analog input signal, make sure it is in the input
range of the ADC. This circuit includes passive attenuation network, impedance
transformat
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